Please use this identifier to cite or link to this item: https://cris.library.msu.ac.zw//handle/11408/1855
Title: Electrical and structural characterization of metal germanides
Authors: Chawanda, Albert
Keywords: Electrical,structural characterization, metal germanides
Issue Date: 2010
Publisher: University of Pretoria
Abstract: Metal-semiconductor contacts have been widely studied in the past 60 years. These structures are of importance in the microelectronics industry. As the scaling down of silicon-based complementary metal-oxide-semiconductor (CMOS) devices becomes more and more challenging, new material and device structures to relax this physical limitation in device scaling are now required. Germanium (Ge) has been proposed as a potential alternative to silicon.
URI: repository.up.ac.za/dspace/bitstream/handle/2263/28009/00front.pdf?sequence
http://hdl.handle.net/11408/1855
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