https://cris.library.msu.ac.zw//handle/11408/1854 Sun, 03 May 2026 04:23:45 GMT 2026-05-03T04:23:45Z https://cris.library.msu.ac.zw//handle/11408/1855 Title: Electrical and structural characterization of metal germanides Authors: Chawanda, Albert Abstract: Metal-semiconductor contacts have been widely studied in the past 60 years. These structures are of importance in the microelectronics industry. As the scaling down of silicon-based complementary metal-oxide-semiconductor (CMOS) devices becomes more and more challenging, new material and device structures to relax this physical limitation in device scaling are now required. Germanium (Ge) has been proposed as a potential alternative to silicon. Fri, 01 Jan 2010 00:00:00 GMT https://cris.library.msu.ac.zw//handle/11408/1855 2010-01-01T00:00:00Z Chawanda, Albert